X-Ray Fluorescence Spectroscopy of Binary Silicate Glasses
نویسندگان
چکیده
منابع مشابه
X - Ray Photoelectron Spectroscopy of Silicate Glasses
X-ray photoelectron spectroscopy (XPS) is a powerful technique capable of providing unique information about the structural chemistry of glasses. However, inappropriate procedures for the preparation of sample surfaces or the lack of reliable methods to overcome electrostatic charging effects during analysis of dielectric materials can cause spurious features to be introduced or intrinsic featu...
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Ti K-edge XANES spectra have been collected on a series of Ti-bearing silicate glasses with metasilicate and tetrasilicate compositions. The intensity of the preedge feature in these spectra has been found to change with glass composition and varies from 29 to 58% (normalized intensity) suggesting a variation in structural environent around the absorbing atom. The pre-edge peak intensity increa...
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Strong characteristic Kα X-ray lines are accompanied by weak lines due to the radiative Auger effect (RAE) [1, 2]. The characteristic Kα fluorescent X-rays (K-L2,3 lines) are emitted by the 2p→1s electric dipole transition after one of the 1s electron photoionization, Though the probability is less than 0.01, one of the 2p electrons is excited into an unoccupied discrete or continuum level simu...
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Introduction: With the extensive application of radiation sources and radioactive materials in various fields, the study of attenuation and absorption of X-rays and gamma-rays in several materials has become an essential and interesting field of research. Glass materials are possible alternatives of concretes for radiation-shielding materials. Materials and Methods:...
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ژورنال
عنوان ژورنال: Bulletin of the Chemical Society of Japan
سال: 1978
ISSN: 0009-2673,1348-0634
DOI: 10.1246/bcsj.51.780